Calibration Specimens & Standards

Reference Materials For Surface And X-Ray Analysis

High Purity Reference Elements and Compounds for Micro and Macro Analysis

  • Appropriate for spectral and intensity references in the following spectroscopies:Auger, XPS, ESCA, SEM/X-ray, Electron microprobe, etc.
  • Custom and standard reference material (RM) configurations available.
  • Ultra high vacuum (UHV) compatible (10-10 torr).
  • Choices of rectangular or circular retainers holding from 6 to 37 RMs.
  • Retainers machined from SS304.
  • Custom mounting bases are available for VG, AMRAY and Perkin-Elmer instruments.
  • Each RM is individually and separately:
    - Prepared from bulk powdered materials.
    - Polished with the most appropriate protocol.
    - Easily removable and re-insertable from the retainer.

All prices are in Canadian Dollars. To request a price quotation or for other inquiries, please contact us.

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